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DFM A/S

Matematiktorvet 307, 1. sal

DK-2800 Kgs. Lyngby

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Du er velkommen til at downloade materialet

Sikkerhedsdatablade (SDS - Safety Data Sheet)

Referencemateriale 0.01 S/m R03.001 (engelsk)

Referencemateriale 0.1 S/m R03.002 (engelsk)

Referencemateriale 1 S/m R03.003 (engelsk)

Referencemateriale 10 S/m R03.004 (engelsk)

 

Manuskript bag prisbelønnet paper om kalibrering af ultra rent vand 

“Direct Traceability for Ultra-Pure Water Conductivity” by Hans D. Jensen, DFM

Udviklingen af en målecelle, der gør det muligt at lave direkte sporbare målinger af ledningsevnen af ultrarent vand.

Læs hele manuskriptet her

 

 

Nanometrology - an introduction | Poul-Erik Hansen DFM et al.

Why should we care about nanometrology?
Why is nanometrology important?
What are the main challenges for nanometrology?
Nanotechnology takes place at the atomic, molecular, meso- and microscopic levels where at least one dimension is below 100nm.
This guide introduces the reader to the science of measurements at the nanoscale, that is nanometrology.

Download here

 

Metrology in short

The main purpose of “Metrology – in short” 3rd edition is to increase awareness of metrology and to establish a common metrological frame of reference. It is meant to provide users of metrology with a transparent and handy tool to obtain metrological information.

Download it here