Tailored courses for your needs, a two-day course where you meet others with the same challenges or a free of charge afternoon meeting. We cover a lot of disciplines, just contact us or see more here
DFM has an up-to-date fleet of instruments at our facilities. You may even lease some of the equipment, with DFM scientists participating. The equipment includes Atomic Force Microscope (AFM), confocal and interference microscopes, polarimeters, and much more. Contact us or see more here
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Get your silicon line gratings characterized, expressed in terms of line width (CD), height and sidewall angle.
DFM masters leading-edge scatterometry technology to measure the essential parameters for silicon line gratings. Now, this service is made available to the semiconductor industry and the research community, among others.
The service is traceable to primary angle and wavelength standards.